| DTG5274 Description | | Data Timing Generator | | DTG5274 Vendor | | Tektronix | | DTG5274 Categories | | | DTG5274 Features | - Up to 2.7 Gbps data rate, extendable to 3.35 Gbps
- From 2 to 96 Data Channels (Master/Slave) and close to 1,000 through clock synchronization
- Class leading delay resolution and range
- 0.2 ps (DTG5274), 1 ps (DTG5078) delay resolution
- Up to 600 ns of total delay
- Versatile platform combines features of data generator, pulse generator, and DC source
- Modular architecture helps to protect your investment and allows the instrument to expand with your growing needs
- Advanced control over signal parameters to meet most current testing needs; like stressed eye generation
- Built-in jitter generation and crossing point control
- Level control with 5 mV resolution
- variable edge slew rates
- Easy to use and learn shortens time to test
- Plug-in modules easily configure instrument to your needs
- Intuitive user interface based on Windows 2000
- Convenient bench top form factor
- Integrated PC supports network integration and built-in CD-ROM, LAN, floppy drive, USB ports
- Up to 32 Mbit pattern depth supports long data patterns
| | DTG5274 Applications | - Semiconductor device functional test and characterization
- Support for semiconductor technologies from TTL to LVDS, depending on output module
- Initial verification and debugging, comprehensive characterization, manufacturing and quality control
- Compliance and interoperability testing to emerging standards
- PCI-Express
- InfiniBand
- RapidIO
- DVI
- HDMI
- Magnetic and optical storage design
- Characterization and functional testing of next-generation magnetic and optical storage devices (HD, CD/DVD/Blue-ray)
- Jitter transfer and jitter tolerance testing
| | DTG5274 Datasheet and Application Notes | | | Products related to DTG5274 | | DTG5078 |
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