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SMU200A Features- Up to Two Baseband Paths in One Instrument Enable Interference, Multi-standard and Transmit Diversity Testing.
- Up to Two RF Paths in One Instrument Save Space in the Manufacturing Test Rack.
- Frequency Setting Time of 3 ms over GPIB and 450 ?s in List Mode Increases Test Throughput.
- I/Q Signal Generation in Real-time Supports all Present and Future Wireless Standards and BER/BLER Testing Without Wrap-around Problems.
- High ACLR of typ. +70 dB for 3 GPP FDD and Low SSB Phase Noise of typ. -135 dBc Enable Design and Production Test of High Performance Base Station Amplifiers.
- I/Q Modulator with RF Bandwidth of 200 MHz Enables Design and Production Test of Multi-carrier Amplifiers and Broadband Systems.
- Very High Level Repeatability of 0.05 dB Assures Repeatable Test Conditions.
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